Torsten Sievers studied physics from 1997 to 2002 at the University of Oldenburg in Germany. His area of expertise was optics and laser physics and his diploma thesis dealt with digital speckle pattern interferometry. Since 2002 he is working at the Division Microrobotics and Control Engineering as research associate on his PhD thesis. His research interest is real-time tracking of micro- and nanoobjects inside a scanning electron microscope. He is developing image processing algorithms for the automation of micro- and nanohandling tasks.